Transesophageal Echocardiography for Device Closure of Atrial Septal Defects. Case Selection, Planning, and Procedural Guidance

Balu Vaidyanathan, John M. Simpson, Raman Krishna Kumar*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

38 Citations (Scopus)
Original languageEnglish
Pages (from-to)1238-1242
Number of pages5
JournalJACC: Cardiovascular Imaging
Volume2
Issue number10
DOIs
Publication statusPublished - Oct 2009
Externally publishedYes

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