Retrospective radiation dosimetry using OSL of electronic components: Results of an inter-laboratory comparison

C. Bassinet*, C. Woda, E. Bortolin, S. Della Monaca, P. Fattibene, M. C. Quattrini, B. Bulanek, D. Ekendahl, C. I. Burbidge, V. Cauwels, Eftychia Kouroukla, T. Geber-Bergstrand, A. Mrozik, B. Marczewska, P. Bilski, S. Sholom, S. W.S. McKeever, R. W. Smith, I. Veronese, A. GalliL. Panzeri, M. Martini

*Corresponding author for this work

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