A two frequency electrochemical etch for routine processing of neutron dosemeters at the NRPB?

R. J. Tanner; D. T. Bartlett; S. M. Williams; J. D. Steele; S. F. Dean

doi:10.1016/1359-0189(91)90177-J

A two frequency electrochemical etch for routine processing of neutron dosemeters at the NRPB?

R. J. Tanner^*, D. T. Bartlett, S. M. Williams, J. D. Steele, S. F. Dean

^*Corresponding author for this work

HP: Radiation Metrology

Research output: Contribution to journal › Article › peer-review

Abstract

An overnight two frequency (50 Hz and 2 kHz) electrochemical etch (ECE) for PADC dosemeters has been developed, with the intention of it succeeding the single frequency (2 kHz) ECE currently used for the routine processing of neutron dosemeters. This is discussed in terms of sensitivity and background, and their optimisation with respect to the etching parameters. Particular reference is made to the improvement in energy response and the effect of raised backgrounds upon minimum detectable dose equivalent values.

Original language	English
Pages (from-to)	217-222
Number of pages	6
Journal	International Journal of Radiation Applications and Instrumentation. Part
Volume	19
Issue number	1-4
DOIs	https://doi.org/10.1016/1359-0189(91)90177-J
Publication status	Published - 1991

Keywords

American Acrylics
Background
CR39
Electrochemical Etching
Neutron
PADC
Pershore
Personal Dosemeter
SSNTD

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10.1016/1359-0189(91)90177-J

Cite this

@article{3baa5374c71c4a0496017de929f9e156,

title = "A two frequency electrochemical etch for routine processing of neutron dosemeters at the NRPB?",

abstract = "An overnight two frequency (50 Hz and 2 kHz) electrochemical etch (ECE) for PADC dosemeters has been developed, with the intention of it succeeding the single frequency (2 kHz) ECE currently used for the routine processing of neutron dosemeters. This is discussed in terms of sensitivity and background, and their optimisation with respect to the etching parameters. Particular reference is made to the improvement in energy response and the effect of raised backgrounds upon minimum detectable dose equivalent values.",

keywords = "American Acrylics, Background, CR39, Electrochemical Etching, Neutron, PADC, Pershore, Personal Dosemeter, SSNTD",

author = "Tanner, {R. J.} and Bartlett, {D. T.} and Williams, {S. M.} and Steele, {J. D.} and Dean, {S. F.}",

year = "1991",

doi = "10.1016/1359-0189(91)90177-J",

language = "English",

volume = "19",

pages = "217--222",

journal = "International Journal of Radiation Applications and Instrumentation. Part",